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WAN ACCESS PRODUCTS
TEST EQUIPMENT
sales@telinc.com
support@telinc.com
5941 Atkinson Road
Suite B
New Hope, PA 18938
800-257-5110 856-489-0700
Fax: 856-489-1785
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WAN
Tester I
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131K
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Tests
asynchronous, synchronous, T-1, fractional T-1, E-1
and fractional E-1 facilities and equipment |
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V.35,
RS232, RS422/RS530, X.21, T-1 and E-1 interfaces |
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Data
rates from 50 bps to 10 Mbps |
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Built-in speaker for monitoring DS0s or timeslots |
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Displays
G.821 performance measurements |
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Terminate and Monitor |
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Front
Panel, VT100 console control or Command Line Interface |
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AC
or battery power |
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The
Telinc WAN Tester is a sophisticated bit error rate tester
in a compact, hand held package. It can test a wide variety
of communications facilities and equipment including
T-1, fractional T-1, E-1, fractional E-1, modems, multiplexers,
CSU/DSUs, T-1 ESF CSUs, DU, NTUs and TIUs. It is supplied
complete with V.35, RS232, RS422/RS530, X.21, DS1 (T-1,
1.544 Mbps) and G.703 (E-1, 2.048 Mbps) interfaces.
The
Tester is supplied with a wall-mounted AC transformer.
A battery option is also available for complete portable
operation. With the option, a nickel metal hydride
battery and a recharger are built into the Tester.
T-1
and E-1 Testing
The
user can choose from four operating modes: T-1, E-1,
asynchronous and synchronous. A variety of test patterns
can be inserted in all or selected time slots/DS0s,
continuous or non-contiguous, making the Tester ideal
for fractional T-1 and E-1 testing.
In
the T-1 and E-1 modes, the WAN Tester counts and displays
bit errors, transmit and receive frequency, test seconds,
bit error rate, and G.821 performance measurements (errored
seconds, severely errored seconds, degraded minutes and
available and unavailable times). In the T-1 mode it
also displays receive level. |
Asynchronous
and Synchronous Testing
In
addition to T-1 and E-1, the WAN Tester provides asynchronous
and synchronous test modes. It generates test data
in a choice of patterns and formats. The user can choose
from a selection of twenty-eight asynchronous and seventy-five
synchronous test speeds.
The
Tester counts and displays bit errors, bit error rate,
and total test seconds. In the asynchronous mode, it
also counts and displays characters received, character
errors and errored seconds. In the synchronous mode,
it also displays transmit frequency, receive frequency,
clear to send delay and G.821 performance measurements.
Easy
to use
The
WAN Tester I can be controlled from the front panel
or from a local or remote VT100 terminal. It includes
a two-line LCD display and sixteen indicator lights
that show selected mode, test and operating parameters.
Parameters are selected by scrolling through values
stored in the Tester. All operations can be performed
using only ten keys. |
Specifications
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ASYNC
Speeds: |
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50 to 115,000
bps |
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Displays: |
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Character Errors,
Characters Received, Total Test Seconds, Errored Seconds,
Round Trip Delay and Elapsed Time |
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LEDS: |
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Pattern Lock,
Pattern Recovered, TXD, RXD, RTS, CTS, DSR, CD, and
DTR |
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Patterns: |
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2^9 (511),
2^11 (2047), Binary, Fox Test, Mark, Space and Round
Trip Delay |
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Loops: |
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Self-Test |
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Interfaces: |
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V.35, RS530,
RS422 and RS232 Physical: DB 25 pin Female |
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SYNC
Speeds: |
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1,200 to 50,000,000 bps |
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Displays: |
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Bit Errors,
Bit Error Rate, Test Secs, Errored Secs, Severely Errored
Secs, Degraded Mins, Available, Unavailable, RX Freq,
TX Freq, Bits Received, RTS Time, Round Trip Delay
and Elapsed Time |
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LEDS: |
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Pattern Lock,
Pattern Recovered, Transmit Data, Receive Data, RTS
(C), CTS, DSR, CD (I), DTR, TXC, RXC (S), and External
TXC |
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Patterns: |
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2^9 (511),
2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20,
2^23, ITU 2^23, 1 of 8, 3 of 24, Alt, Mark, Space and
Round Trip Delay |
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Loops: |
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Self-Test and
V.54 |
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Interfaces: |
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V.35/DB25,
RS530/DB25, RS422/DB25, RS232/DB25, and X.21/DB15 pin |
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T-1
Speeds: |
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1,544,000 bps |
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Displays: |
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Bit Errors,
Bit Error Rate, Test Secs, Errored Secs, Severely Errored
Secs, Degraded Mins, Available, Unavailable, RX Freq,
TX Freq, Signalling Bits, Density Errs, Frame Errs,
CRC Err, BPV Err, RX Level Volts & dB, Slips, Round
Trip Delay |
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LEDS: |
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Pattern Lock,
Pattern Recovered, Frame Lock, AIS (Blue), RLOS, CRC
Err, BPV, D4, ESF, AMI, B8ZS and Yellow |
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Patterns: |
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2^9 (511),
2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20,
2^23, ITU 2^23, 1 of 8, 3 of 24, T-1 DALY, T-1 DALY
UF, 55 Octet, 55 Octet UF, Alt, Mark, Space , Digimwatt,
User 3 - 32, Round Trip Delay, DDS OCU Loop, DDS CSU
Loop and DDS DSU Loop |
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Loops: |
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Self-Test,
ATT Loop U/D, ANSI Loop U/D, ATT Payload, ANSI Payload,
Smart Jack 1 & 2 (Framed & Unframed) and V.54 |
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Speaker: |
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Monitors selected TX or RX DS0 for voice |
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Interfaces: |
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DS1 BiPolar, 110 Ohm, AMI/B8ZS
Coding |
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Physical: |
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RJ48C and
Dual Bantam |
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E-1
Speeds: |
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2,048,000 bps |
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Displays: |
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Bit Errors,
Bit Error Rate, Test Secs, Errored Secs, Severely Errored
Secs, Degraded Mins, Available, Unavailable, RX Freq,
TX Freq, Slips, CRC Errs, BPV Errs and Frame Errs |
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LEDS: |
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Pattern Lock,
Pattern Recovered, Frame Lock, AIS (Blue), RLOS, CRC
Err, BPV, DMFA and RRA |
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Patterns: |
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2^9 (511),
2^11 (2047), 2^15, ITU 2^15, QRSS, 2^20, ITU 2^20,
2^23, ITU 2^23, 1 of 8, 3 of 24, Alt, Mark, Space,
Digimwatt and User 3 - 32 |
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Loops: |
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Self-Test and
V.54 |
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Speaker: |
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Monitors selected TX or
RX timeslot for voice |
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Interfaces: |
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G.703/704, 75 & 120
Ohm, HDB3 Coding |
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Physical: |
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Dual Bantam,
Dual BNC and RJ48C |
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Physical
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Mechanical: |
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The WAN
Tester I measures 5" (12.7 cm) H x 7" (17.8
cm) W x 2" (5.1 cm) D and weighs 1 lb (.45 kg) |
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